Presentation by Ichiro Shibata, Director of Analytics Solutions at Altair.
New design concept for predictive maintenance using IoT, CAE and AI. Through the development process of an apparatus demonstration, you will learn how to utilize topology optimization and 3D-printing to improve the accuracy of deep learning inference. The combination of deductive approach by CAE and inductive approach by AI makes it possible to see target areas that have been impossible so far. You will also learn how Raspeberry Pi device can be implemented as a deep learning technology for real-time machine condition monitoring.
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